About Us
Factory Tour
Quality Control
Contact Us
Request A Quote
Dongguan Zhongli Instrument Technology Co., Ltd.
Home ProductsPackaging Testing Equipment

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

China Dongguan Zhongli Instrument Technology Co., Ltd. certification
China Dongguan Zhongli Instrument Technology Co., Ltd. certification
Exceptional company. 5 STAR!!! Ship rapidly the item and very WELL packed and protected.Very good machinery and very good communication with company. i more than highly recommend using Dongguan Zhongli Instrument.

—— Remy Attalin

The response from the seller was very fast and helpful. Issuing and confirming the PO/PI was done in a single day. The product was shipped the next day after the transaction is confirmed. Couldn't be more satisfied in terms of service provided by the seller. The machine is well packed in wooden case. Everything arrived in good condition. Come with

—— Warunee Nahauythong

I'm Online Chat Now

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

small.img.alt small.img.alt small.img.alt

Large Image :  ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

Product Details:
Place of Origin: China
Brand Name: ZL
Certification: CE,ISO
Model Number: ZL-1210
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: Negotiable
Packaging Details: ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers is packaged within wooden case.
Delivery Time: 5-8 work days
Payment Terms: L/C, T/T, Western Union
Supply Ability: 60 Sets
Detailed Product Description
Product Name: ISO 4593 Film Thickness Gauge With 0.1 μm Resolution For Paper , Silicon Wafers Test Range: 0~2 Mm (conventional) 0~6 Mm; 12 Mm (optional)
Measuring Speed: 10 Times/min (adjustable) Test Pressure: 17.5±1 KPa (film); 50±1 KPa (paper)
Sample Injection Step: 0~1000 Mm Sample Injection Speed: 0.1~99.9 Mm/s
Power Supply: AC 220V 50Hz Net Weight: 32 Kg
High Light:

ISO 4593 Packaging Testing Equipment


99.9 mm/s Packaging Testing machine

ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers





ZL-1210 Thickness Gauge adopts mechanical contact measurement method, which strictly meets the standard requirements, effectively ensuring the standardization and accuracy of the test. Professionally applicable to the accurate measurement of the thickness of various materials such as plastic films, sheets, diaphragms, paper, foils, silicon wafers, etc. within the measuring range.




  • Strictly designed contact area and measured pressure in accordance with standards, while supporting various non-standard customizations;
  • The measuring head is automatically raised and lowered during the test, which effectively avoids system errors caused by human factors;
  • Support both automatic and manual measurement modes, to facilitate users to choose freely;
  • The system automatically injects samples, and the relevant parameters such as sampling step, measuring points and sampling speed can be set by the user;
  • Real-time display of analysis data such as the maximum, minimum, average and standard deviation of measurement results to facilitate user judgment;
  • Equipped with standard gauge blocks for system calibration to ensure test accuracy and data consistency;
  • The system supports many practical functions such as real-time data display, automatic statistics, printing, etc., to obtain test results conveniently and quickly;
  • The system is controlled by a microcomputer, with LCD display, menu interface and PVC operation panel, which is convenient for users to conduct test operation and data viewing;
  • The standard USB interface is convenient for the external connection and data between the system and the computer.





Basic applications

Sheets, diaphragms, paper, cardboard, foil, silicon wafers, metal sheets, textile materials, solid electrical insulators, non-woven fabric materials, such as diapers, sanitary napkin sheets, etc.


Test principle:


The ZL-1210 film thickness measuring instrument adopts the principle of mechanical contact measurement to intercept a certain size of the pattern; through the control panel buttons, the measuring head is adjusted to fall on the pattern; the pressure generated by the two contact surfaces and the two contact areas are measured by the sensor The numerical value measures the thickness of the material.



Standard test:


The instrument complies with many national and international standards: ISO 4593, ISO 534, ISO 3034, GB/T 6672, GB/T 451.3, GB/T 6547, ASTM D374, ASTM D1777, TAPPI T411, JIS K6250, JIS K6783, JIS Z1702, BS 3983, BS 4817


Technical index:


Model ZL-1210 Film Thickness Gauge


Test range

0~2 mm (conventional)

0~6 mm; 12 mm (optional)

Resolution 0.1 μm
Measuring speed 10 times/min (adjustable)
Test pressure 17.5±1 KPa (film); 50±1 KPa (paper)
Contact area

50 mm² (film); 200 mm² (paper)

Note: Choose one of film or paper; non-standard can be customized

Sample injection step 0~1000 mm
Sample injection speed 0.1~99.9 mm/s
Power supply AC 220V 50Hz
Dimensions 461 mm(L)× 334 mm(W)× 357 mm(H)
Net weight 32 kg



Product configuration:


Standard configuration host, one standard gauge block, communication cable, measuring head
Optional parts Non-standard measuring head, counterweight, professional software



ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers 0

Contact Details
Dongguan Zhongli Instrument Technology Co., Ltd.

Contact Person: Vilya

Tel: +8613415952714

Send your inquiry directly to us (0 / 3000)